AEHR TEST SYSTEMS
Sector: Electronics - Measuring Inst
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Aehr Test Systems engages in the development and manufacture of burn-in and test equipment for the semiconductor industry. Its principal products include the MTX massively parallel test system, the MAX burn-in systems, the FOX full wafer contact system, and the DiePak carrier. The MTX system performs both test and burn-in on thousands of memory devices simultaneously, including DRAMs, flash memories, SDRAMs, DDR SDRAMs, DDR II SDRAMs, and SRAMs. The MAX system is designed for dynamic burn-in of memory and logic devices, such as digital signal processors, microprocessors, microcontrollers, and systems-on-a-chip. The FOX system is designed to make contact with various pads of a wafer, thus enabling full wafer burn-in and parallel test of up to 14 IC wafers at a time. The DiePak carrier is a reusable, temporary package that enables integrated circuit manufacturers to perform final test and burn-in of bare die. The company also manufactures and sells, and licenses others to manufacture and sell custom-designed test fixtures for its systems, which hold the devices undergoing test or burn-in and electrically connect the devices under test to the system electronics. In addition, it provides customer service and support programs, including system installation, system repair, applications engineering support, spare parts inventories, customer training, and documentation. The company markets and sells its products to semiconductor manufacturers, semiconductor contract assemblers, electronics manufacturers, and burn-in and test service companies worldwide. Aehr Test Systems was founded by Rhea J. Posedel in 1977 and is headquartered in Fremont, California.