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KLA-Tencor Corporation engages in the design, manufacture, and marketing of yield management and process monitoring systems for the semiconductor industry. It markets and sells its hardware consisting of patterned and unpatterned wafer inspection, optical overlay metrology, e-beam review, reticle and photomask inspection, spectroscopic and e-beam-based CD metrology, and film and surface measurement tools, as well as its yield analysis and defect classification software. The company's products provide fab-wide yield management solutions for the manufacturing process of cells used in integrated circuit production, including lithography, etch, deposition, and chemical mechanical planarization. Its products and services enable integrated circuit manufacturers to manage yield throughout the wafer fabrication process from research and development to final mass production yield analysis. The company also offers refurbished KLA-Tencor certified tools for customers manufacturing with older technologies. In addition, the company provides other services, such as onsite repair, telephone support, system installation, relocation services, selected post-sales applications, and educational services. Its yield management software solutions include Klarity Defect, an automated inline defect analysis module and defect data management system designed to help fabs achieve yield learning cycles; and Klarity ACE yield analysis software that enables integration, correlation, and analysis of yield- and process-related data to determine the source of defects and process excursions. KLA-Tencor sells its products through direct sales force and distributors primarily in the United States, Europe, Asia-Pacific region, and Japan. The company was founded in 1975 and is headquartered in San Jose, California.